IEC 61671-4 : 1ED 2016

Table of Contents

1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 TestConfiguration schema
5 TestConfiguration instance schema
6 ATML TestConfiguration XML schema names and
  locations
7 ATML XML schema extensibility
8 Conformance
Annex A (informative) - IEEE download web-site
        material associated with this document
Annex B (informative) - Test Configuration XML
        element mappings to MTPSI card fields
Annex C (informative) - Examples
Annex D (informative) - Bibliography
Annex E (informative) - List of IEEE Participants

Abstract

Specifies an exchange format, utilizing XML, for identifying all of the hardware, software, and documentation that is needed to test and diagnose a UUT on an ATS.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Electrotechnical Committee
Pages
ISBN
Committee	TC 91