IEC 62433-4 : 1ED 2016

Table of Contents

FOREWORD<br>1 Scope<br>2 Normative references<br>3 Terms, definitions, abbreviations and<br>&nbsp;&nbsp;conventions<br>4 Philosophy<br>5 ICIM-CI model description<br>6 CIML format<br>7 Extraction<br>8 Validation of ICIM-CI hypotheses<br>9 Model usage<br>Annex A (normative) - Preliminary definitions<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;for XML representation<br>Annex B (informative) - ICIM-CI example<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;with disturbance load<br>Annex C (informative) - Conversions between<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;parameter types<br>Annex D (informative) - Example of ICIM-CI<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;macro-model in CIML format<br>Annex E (normative) - CIML Valid keywords<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;and usage<br>Annex F (informative) - PDN impedance<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;measurement methods using vector network<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;analyzer<br>Annex G (informative) - RFIP measurement<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;method description<br>Annex H (informative) - Immunity simulation<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;with ICIM model based on pass/fail test<br>Annex I (informative) - Immunity simulation<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;with ICIM model based on non pass/fail<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;test<br>Bibliography

Abstract

Defines a flow for deriving a macro-model to allow the simulation of the conducted immunity levels of an integrated circuit (IC).

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Electrotechnical Committee
Pages
ISBN
Committee	TC 47