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IEC 62435-2 : 1ED 2017

IEC 62435-2 : 1ED 2017

ELECTRONIC COMPONENTS - LONG-TERM STORAGE OF ELECTRONIC SEMICONDUCTOR DEVICES - PART 2: DETERIORATION MECHANISMS

International Electrotechnical Committee

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Table of Contents

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and abbreviated terms
4 Principles of deterioration
5 Technical validation of the components
Annex A (normative) - Failure mechanisms - Encapsulated
        and non-encapsulated active components
Bibliography

Abstract

Provides deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied.

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 47

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