SEMICONDUCTOR DEVICES - FLEXIBLE AND STRETCHABLE SEMICONDUCTOR DEVICES - PART 1: BENDING TEST METHOD FOR CONDUCTIVE THIN FILMS ON FLEXIBLE SUBSTRATES
International Electrotechnical Committee
FOREWORD
1 Scope
2 Normative references
3 Terms, definitions and symbols
4 Test piece
5 Testing method and test apparatus
6 Test report
Annex A (informative) - X-Y-Theta bending test method
Annex B (informative) - Data analysis: Calculation
of bending radius and bending strain
Bibliography
Describes a bending test method to measure the electromechanical properties or flexibility of conductive thin films deposited or bonded on flexible non-conductive substrates.
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 47 |
