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IEC 62969-4:2018 Ed 1.0

IEC 62969-4:2018 Ed 1.0

Semiconductor devices – Semiconductor interface for automotive vehicles – Part 4: Evaluation method of data interface for automotive vehicle sensors

International Electrotechnical Committee

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Scope

This part of IEC 62969 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 47

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