IEEE 300 : 1988

Table of Contents

1. Scope and Object
2. References
3. Symbols and Definitions
3.1 Symbols
3.2 Specialized Definitions
4. Introduction
4.1 Interaction of Charged Particles with Matter
4.2 Semiconductor Charged-Particle Detector
4.2.1 The Basic Detector
4.2.2 Geometry
4.2.3 Material
4.2.4 Fabrication
4.3 Bias Resistor
4.4 Pulse Shaping
4.4.1 Quasi-Gaussian Shaping
4.4.2 Quasi-Triangular Shaping
4.4.3 Waveform Features
4.4.4 Effect of Pulse Shape on SNR and Energy Resolution
4.4.5 Standard Test Conditions
5. General Requirements
6. Resolution Measurements
6.1 Energy Resolution
6.2 Time Resolution
6.2.1 Detector Electrical Rise Time
6.2.2 Charge Collection Time
6.3 Position Resolution and Linearity of a Position-
       Sensitive Detector
7. Noise Measurement
7.1 Noise Measurement by Pulse Height Distribution
7.1.1 Measurement with Radioactive Source Calibration
7.1.2 Measurement with Capacitor and Pulse Generator
       Calibration
7.2 Noise Measurement by Oscilloscope and True Root-
       Mean Square Voltmeter
7.2.1 Measurement with Radioactive Source Calibration
7.2.2 Measurement with Capacitor and Pulse Generator
       Calibration
7.3 Measurement of Electronic Noise with Detector
       Removed
7.4 Determination of Detector Contribution to Noise
       and Resolution
7.5 Noise Linewidth (FWHM) as a Function of Amplifier
       Shaping Index
8. Sensitivity to Ambient Conditions
8.1 Atmospheric Sensitivity
8.2 Vacuum Thermal Cycle Test
8.3 Mechanical and Environmental Tests
8.4 Light Sensitivity
8.5 Radiation Damage
9. Other Measurements
9.1 Current-Voltage Characteristics
9.2 Dead-Layer Energy Loss
9.3 Sensitive Area
9.4 Detective Thickness (Transmission Detectors)
9.5 Capacitance-Voltage Characteristics
10. Bibliography
FIGURES
1. Quasi-Gaussian and Quasi-Triangular Pulse Shapes
2. System Configuration for Spectral Measurements
3. A Typical Spectrum
4. Time Resolution Measurement System
5. Detector Electrical Rise-Time Measurement
6. Position-Sensitive Detector
7. Position-Sensitive Detector Measurements
8. Apparatus for Position Measurements
9. Precision Generator Waveform
10. Noise Measurement by Oscillscope and True RMS
      Voltmeter
11. Detector Current-Voltage Characteristic Measurement

Abstract

Describes semiconductor radiation detectors used for detection and high resolution spectroscopy of charged particles.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	Institute of Electrical & Electronics Engineers
Pages
ISBN