IEEE C62.45 : 2002

IEEE C62.45 : 2002

RECOMMENDED PRACTICE ON SURGE TESTING FOR EQUIPMENT CONNECTED TO LOW-VOLTAGE (1000 V AND LESS) AC POWER CIRCUITS

Institute of Electrical & Electronics Engineers

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Table of Contents

1 Overview
   1.1 Scope
   1.2 Purpose
2 References
3 Definitions
   3.1 Technical terms
   3.2 Special word usage
4 Planning of surge testing: Basic objectives
   4.1 General
   4.2 Surge environment
   4.3 Types of tests
   4.4 Results and consequences of the test
   4.5 Unpowered testing versus powered testing
   4.6 Withstand levels
   4.7 Voltage and current waveforms
   4.8 Safety
5 Implementation of surge testing: Test equipment
   5.1 General
   5.2 Surge generators
   5.3 Point of test surge application
   5.4 Coupling the surge to the EUT
   5.5 Monitoring the EUT
6 Performance of surge testing: Test procedures
   6.1 General
   6.2 Limiting stresses
   6.3 Nature of the EUT
   6.4 Safety
7 Applying the test surge: Coupling and decoupling
   circuits
   7.1 General
   7.2 Requirements for surge coupling
   7.3 Impedance considerations
   7.4 Requirements for surge decoupling
   7.5 Surge coupling
8 Grounding
   8.1 Grounding precautions
   8.2 Grounding practices in EUTs
9 Standard surge tests waveforms
   9.1 General
   9.2 Standard waveforms
   9.3 Test procedures
   9.4 Equations for standard waveforms
10 Additional surge test waveforms
   10.1 General
   10.2 Additional waveforms
   10.3 Equations for additional waveforms
11 Evaluating test results
Annex A (informative) - SPD Class I test parameters
Annex B (informative) - Complementary notes
Annex C (informative) - Practical hints on surge
                        testing
Annex D (informative) - Bibliography

Abstract

Describes surge testing to ac power interfaces of equipment connected to low voltage (up to 1000 V rms) ac power circuits subject to transient overvoltages.

General Product Information

Document Type Standard
Status Current
Publisher Institute of Electrical & Electronics Engineers
Supersedes
  • ANSI C62.45 : 2002

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