IEEE 1620.1 : 2006
IEEE 1620.1 : 2006
TEST METHODS FOR THE CHARACTERIZATION OF ORGANIC TRANSISTOR-BASED RING OSCILLATORS
Institute of Electrical & Electronics Engineers
TEST METHODS FOR THE CHARACTERIZATION OF ORGANIC TRANSISTOR-BASED RING OSCILLATORS
Institute of Electrical & Electronics Engineers
1 Overview
1.1 Scope
1.2 Purpose
1.3 Electrical characterization overview
2 Definitions, abbreviations and acronyms
2.1 Definitions
2.2 Acronyms
3 Standard ring oscillator characterization procedures
3.1 Circuit layout
3.2 Guidelines for the ring oscillator characterization process
3.3 Other applicable standards
3.4 Reporting data
3.5 Environmental control and standards
Annex A (informative) Bibliography
Specifies a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
Document Type | Standard |
Status | Current |
Publisher | Institute of Electrical & Electronics Engineers |
Supersedes |
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