IEEE 592 : 2007
IEEE 592 : 2007
EXPOSED SEMICONDUCTING SHIELDS ON HIGH-VOLTAGE CABLE JOINTS AND SEPARABLE CONNECTORS
Institute of Electrical & Electronics Engineers
Specials
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JIS M 0202:1999
$78.00 (-56%) $34.32
Table of Contents
1 Scope
2 Normative references
3 Performance requirements
4 Test procedures
4.1 Test specimens
4.2 Shield resistance
4.3 Fault-current initiation test
Abstract
Describes design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | Institute of Electrical & Electronics Engineers |
| Superseded By |
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