IEEE 1241 : 2010
IEEE 1241 : 2010
TERMINOLOGY AND TEST METHODS FOR ANALOG-TO-DIGITAL CONVERTERS
Institute of Electrical & Electronics Engineers
Table of Contents
1. Overview
2. Normative references
3. Definitions and symbols
4. General test methods
5. Sine-wave testing and fitting
6. Locating code transitions
7. Analog input
8. Linearity
9. Noise (total)
10. Step response parameters
11. Frequency response parameters
12. Differential gain and phase
13. Aperture effects
14. Additional tests and specification
Annex A (informative) - ADC architectures
Annex B (informative) - Sine-wave fitting algorithms
Annex C (normative) - Discrete Fourier transforms and
windowing
Annex D (informative) - Presentation of sine-wave data
Annex E (informative) - Bibliography
Abstract
Provides common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). It covers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | Institute of Electrical & Electronics Engineers |
| Supersedes |
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