STANDARD TEST METHODS FOR AVALANCHE JUNCTION SEMICONDUCTOR SURGE-PROTECTIVE DEVICE COMPONENTS
Institute of Electrical & Electronics Engineers
1. Scope
2. Definitions
3. V-I Characteristics for a unidirectional ABD
4. Circuit symbols
5. Service conditions
6. Standard design test procedures
7. Failures and fault modes
8. Derived parameters and other test procedures
Annex A (informative) - Bibliography
Pertains to two terminal or multiple terminal silicon avalanche breakdown diodes (ABD), which are one type of surge protective device component (SPDC). Covers terms, symbols and definitions, and gives test methods for verifying ratings and measuring device characteristics.
| Document Type | Standard |
| Status | Current |
| Publisher | Institute of Electrical & Electronics Engineers |
