IEEE 1641 : 2010

Table of Contents

1. Overview
2. Definitions, abbreviations, and acronyms
3. Structure of this standard
4. Signals and SignalFunctions
5. SML layer
6. BSC layer
7. TSF layer
8. Test procedure language (TPL)
9. Maximizing test platform independence
Annex A (normative) - Signal modeling language (SML)
Annex B (normative) - Basic signal components (BSC) layer
Annex C (normative) - Dynamic signal descriptions
Annex D (normative) - Interface definition language (IDL)
        basic components
Annex E (informative) - Test signal framework (TSF) for
        C/ATLAS
Annex F (informative) - Test signal framework (TSF)
        library for digital pulse classes
Annex G (normative) - Carrier language requirements
Annex H (normative) - Test procedure language (TPL)
Annex I (normative) - Extensible markup language (XML)
         signal descriptions
Annex J (informative) - Support for ATLAS nouns and
        modifiers
Annex K (informative) - Guide for maximizing test
        platform independence and test application
        interchangeability
Annex L (informative) - Bibliography

Abstract

Specifies signals used in testing. Presents a set of common basic signal definitions, built upon formal mathematical specifications, so that signals can be combined to form complex signals usable across all test platforms.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	Institute of Electrical & Electronics Engineers
Pages
ISBN