IEEE 1149.4 : 2010

Table of Contents

1. Overview
2. Normative references
3. Definitions, acronyms, abbreviations, and voltage
    symbols
4. Testability architecture
5. Instructions
6. The TBIC
7. The boundary-scan structure
8. Measurement methodology
9. Analog parametric limits
10. Conformance and documentation requirements
Annex A (informative) - Bibliography

Abstract

Covers the test features which are to be included in a mixed-signal (analog and digital) component, with test protocols to provide approaches to; Parametric test, Internal test and Interconnect test.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	Institute of Electrical & Electronics Engineers
Pages
ISBN
Supersedes	IEEE DRAFT 1149.4 : D25 FEB 99