IEEE 1658 : 2011

Table of Contents

1. Overview
2. Normative references
3. Definitions, symbols, acronyms, and abbreviations
4. Test methods
5. Fitting sine waves
6. Digital input
7. Analog inputs
8. Analog output (single-ended and differential)
9. Gain and offset (static and dynamic)
10. Linearity (static and dynamic)
11. Noise
12. Harmonic and spurious distortion
13. Step response parameters
14. Interference-related DAC parameters
15. Frequency response parameters
16. Differential gain and phase
17. Power supply parameters
Annex A (informative) - DAC architectures
Annex B (informative) - Sine-wave fitting algorithms
Annex C (informative) - Discrete Fourier transforms and
        windowing
Annex D (informative) - Software considerations
Annex E (informative) - Base-Band Reconstruction process
Annex F (informative) - Bibliography

Abstract

Specifies terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs).

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	Institute of Electrical & Electronics Engineers
Pages
ISBN