IEEE 1149.8.1 : 2012

Table of Contents

1. Overview
2. Normative references
3. Definitions
4. Technology
5. Instructions
6. Pin implementation specifications
7. Toggle_Control register
8. Conformance and documentation requirements
Annex A (informative) - Unpowered testing for open
        connections on printed circuit assemblies
Annex B (informative) - Boundary register cells that
        support ST-pins and IEEE 1149.6 ac-pins
Annex C (informative) - Bibliography

Abstract

Describes extensions to IEEE 1149.1[TM] that define the boundary-scan structures and methods required to facilitate boundary-scan-based stimulus of interconnections to passive and/or active components.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	Institute of Electrical & Electronics Engineers
Pages
ISBN