IEEE 1671.5 : 2015
IEEE 1671.5 : 2015
AUTOMATIC TEST MARKUP LANGUAGE (ATML) TEST ADAPTER DESCRIPTION
Institute of Electrical & Electronics Engineers
Specials
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API MPM CH14.5 : 2009
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Table of Contents
1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 TestAdapterDescription Schema
5 Schema - TestAdapterInstance.xsd
6 ATML TestAdapterDescription XML schema
names and locations
7 ATML XML schema extensibility
8 Conformance
Annex A (informative) - IEEE download website
material associated with this document
Annex B (informative) - Users information and
examples
Annex C (informative) - Glossary
Annex D (informative) - Bibliography
Abstract
Specifies an exchange format, utilizing XML, for both the static description of a test adapter by defining the interface between the UUT and the test station, and the specific description of test adapter instance information.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | Institute of Electrical & Electronics Engineers |
