IEEE 1804 : 2017

Table of Contents

1. Overview
2. Definitions, acronyms, and abbreviations
3. Fault classification and test coverage reporting
4. Fault modeling
5. Fault accounting methods and rules
6. Summary
Annex A (informative) - Bibliography

Abstract

Specifies aspects of the stuck-at fault model as they are relevant to the generation of test patterns for digital circuits.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	Institute of Electrical & Electronics Engineers
Pages
ISBN