MEASUREMENT OF RADIATED EMISSIONS FROM INTEGRATED CIRCUITS - TEM/WIDEBAND TEM (GTEM) CELL METHOD; TEM CELL (150 KHZ TO 1 GHZ), WIDEBAND TEM CELL (150 KHZ TO 8 GHZ)
SAE International
1 Scope
2 References
3 Definitions
4 Test Conditions
5 Test equipment
6 Test set-up
7 Test procedure
8 Data presentation
9 IC Emissions reference levels
10 Notes
Appendix A - Example calibration and set up verification sheet
Appendix B - 1 GHz tem cell and wideband tem cell
Appendix C - Calculation of dipole moment from measured data
Appendix D - Specification of emission levels
Describes a method for measuring the electromagnetic radiation from an integrated circuit (IC).
| Document Type | Standard |
| Status | Current |
| Publisher | SAE International |
