JIS H 0604:1995
JIS H 0604:1995
Measuring of minority-carrier lifetime in silicon single crystal by photoconductive decay method
Japanese Standards Association
Specials
-
-
AS/NZS 61241.4:2002
$78.00 (-56%) $34.32
Table of Contents
Abstract
This Japanese Industrial Standard specifies the measurement of minority-carrier bulk recombination lifetime (hereafter, referred to as bulk lifetime or b) in silicon single crystal by d.c. photoconductive decay method. The single crystal to be measured shall have a homogeneous composition, of which the rsistivity shall be at least 1 ohm.cm.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | Japanese Standards Association |
