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JIS Z 4334:2005

JIS Z 4334:2005

Reference sources for the calibration of surface contamination monitors - Beta-emitters (maximum beta energy greater than 0.15 MeV) and alpha-emitters

Japanese Standards Association

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Abstract

This Standard specifies the characteristics of reference sources of large area for the calibration of surface contamination monitors.

General Product Information

Document Type Standard
Status Current
Publisher Japanese Standards Association
Supersedes
  • JIS Z 4334:1992

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