JIS R 1633:1998

Table of Contents

1 - 
2 - 
3 - 
4 - 
5 - 
6 - 

Abstract

This Japanese Industrial Standard specifies the sample preparation method of bulk fine ceramics and fine ceramic powders for scanning electron microscope (SEM) observation using the SEM which is capable f observing the sample not in the dry condition, the volatile sample, and the non-conductive sample, is not provided with any special function nor structure, and is capable of being using under the pressure in the sample chamber of 10*2 Pa or under.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	Japanese Standards Association
Pages
ISBN