JIS K 5600-1-7:2014

Table of Contents

Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Determination of wet-film thickness
5 Determination of dry-film thickness
6 Determination of thickness of uncured powder layers
7 Measurement of film thickness on rough surfaces
8 Test report
Annex A (informative) - Overview of methods
Annex B (informative) - Dial gauge
Annex C (informative) - Photothermal method
Annex D (informative) - Magnetic-flux gauge
Bibliography
Annex JA (informative) - Comparison table between JIS and
corresponding International Standard

Abstract

Defines a number of methods that are applicable to the measurement of the thickness of coatings applied to a substrate.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	Japanese Standards Association
ProductNote	Supersedes JIS K5400. (06/2002)
Pages
ISBN
Supersedes	JIS K 5400:1990 JIS K 5600-1-7:1999